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Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
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Authors
Tang, Baojun
;
Toledano Luque, Maria
;
Zhang, W.D.
;
Van den Bosch, Geert
;
Degraeve, Robin
;
Zhang, J.F.
;
Van Houdt, Jan
Conference
18th Conference of Insulting Films on Semiconductors - INFOS: Book of Abstracts
Title
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Publication type
Meeting abstract
Embargo date
9999-12-31
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