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dc.contributor.authorThean, Aaron
dc.contributor.authorWambacq, Piet
dc.contributor.authorLee, Jae Woo
dc.contributor.authorCho, Moon Ju
dc.contributor.authorVeloso, Anabela
dc.contributor.authorSasaki, Yuichiro
dc.contributor.authorChiarella, Thomas
dc.contributor.authorMiyaguchi, Kenichi
dc.contributor.authorParvais, Bertrand
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorKim, Min-Soo
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorDehan, Morin
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorCollaert, Nadine
dc.contributor.authorVerkest, Diederik
dc.date.accessioned2021-10-21T12:41:31Z
dc.date.available2021-10-21T12:41:31Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23164
dc.sourceIIOimport
dc.titleImpact of multi-gate device architectures on digital and analog circuits and its implications on system-on-chip technologies
dc.typeProceedings paper
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorMiyaguchi, Kenichi
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorKim, Min-Soo
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecMiyaguchi, Kenichi::0000-0002-7073-6457
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecKim, Min-Soo::0000-0003-0211-0847
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage448
dc.source.endpage451
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate9/12/2013
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - open access


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