Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
2D and 3D photoresist line roughness characterization
Publication:
2D and 3D photoresist line roughness characterization
Copy permalink
Date
2013
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
27237.pdf
2.12 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vaglio Pret, Alessandro
;
Kunnen, Eddy
;
Gronheid, Roel
;
Pargon, Erwine
;
Luere, Olivier
;
Bianchi, Davide
Journal
Microelectronic Engineering
Abstract
Description
Metrics
Views
1984
since deposited on 2021-10-21
1
last month
1
last week
Acq. date: 2025-12-10
Citations
Metrics
Views
1984
since deposited on 2021-10-21
1
last month
1
last week
Acq. date: 2025-12-10
Citations