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IGZO Schottky diode as a material characterization tool: DLTS and noise measurements

dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorSimoen, Eddy
dc.contributor.authorBhoolokam, Ajay
dc.contributor.authorNag, Manoj
dc.contributor.authorGenoe, Jan
dc.contributor.authorGielen, Georges
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-21T13:08:41Z
dc.date.available2021-10-21T13:08:41Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23218
dc.sourceIIOimport
dc.titleIGZO Schottky diode as a material characterization tool: DLTS and noise measurements
dc.typeOral presentation
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorNag, Manoj
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceMRS Fall Meeting Symposium R: Oxide Semiconductors
dc.source.conferencedate1/12/2013
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - open access


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