dc.contributor.author | Vanstreels, Kris | |
dc.contributor.author | Wu, Chen | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | Schneider, Dieter | |
dc.contributor.author | Gidley, David | |
dc.contributor.author | Verdonck, Patrick | |
dc.contributor.author | Baklanov, Mikhaïl | |
dc.date.accessioned | 2021-10-21T13:52:06Z | |
dc.date.available | 2021-10-21T13:52:06Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0743-7463 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23308 | |
dc.source | IIOimport | |
dc.title | Effect of pore structure of nanometer scale porous films on the measured elastic modulus | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vanstreels, Kris | |
dc.contributor.imecauthor | Wu, Chen | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | Verdonck, Patrick | |
dc.contributor.orcidimec | Vanstreels, Kris::0000-0002-4420-0966 | |
dc.contributor.orcidimec | Wu, Chen::0000-0002-4636-8842 | |
dc.contributor.orcidimec | Verdonck, Patrick::0000-0003-2454-0602 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 12025 | |
dc.source.endpage | 12035 | |
dc.source.journal | Langmuir | |
dc.source.issue | 38 | |
dc.source.volume | 29 | |
dc.identifier.url | http://pubs.acs.org/doi/abs/10.1021/la402383g?prevSearch=vanstreels&searchHistoryKey= | |
imec.availability | Published - imec | |