Effect of pore structure of nanometer scale porous films on the measured elastic modulus

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Authors
Vanstreels, Kris; Wu, Chen; Gonzalez, Mario; Schneider, Dieter; Gidley, David; Verdonck, Patrick; Baklanov, Mikhaïl
ISSN
0743-7463
Issue
38
Journal
Langmuir
Volume
29
Title
Effect of pore structure of nanometer scale porous films on the measured elastic modulus
Publication type
Journal article
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