dc.contributor.author | Verdonck, Patrick | |
dc.contributor.author | Maheshwari, Abhishek | |
dc.contributor.author | Swerts, Johan | |
dc.contributor.author | Tielens, Hilde | |
dc.contributor.author | Franquet, Alexis | |
dc.contributor.author | Loyo Prado, Jana | |
dc.contributor.author | Armini, Silvia | |
dc.contributor.author | Baklanov, Mikhaïl | |
dc.contributor.author | Van Elshocht, Sven | |
dc.contributor.author | Uedono, Akira | |
dc.contributor.author | Roque Huanca, Danilo | |
dc.contributor.author | Gomes dos Santos Filho, Sebastiao | |
dc.contributor.author | Kellerman, Guinther | |
dc.date.accessioned | 2021-10-21T14:02:17Z | |
dc.date.available | 2021-10-21T14:02:17Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 2162-8769 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23325 | |
dc.source | IIOimport | |
dc.title | Detailed characterization of the effects of plasma treatments on an advanced 2.0 low-k material | |
dc.type | Journal article | |
dc.contributor.imecauthor | Verdonck, Patrick | |
dc.contributor.imecauthor | Swerts, Johan | |
dc.contributor.imecauthor | Tielens, Hilde | |
dc.contributor.imecauthor | Franquet, Alexis | |
dc.contributor.imecauthor | Loyo Prado, Jana | |
dc.contributor.imecauthor | Armini, Silvia | |
dc.contributor.imecauthor | Van Elshocht, Sven | |
dc.contributor.orcidimec | Verdonck, Patrick::0000-0003-2454-0602 | |
dc.contributor.orcidimec | Franquet, Alexis::0000-0002-7371-8852 | |
dc.contributor.orcidimec | Armini, Silvia::0000-0003-0578-3422 | |
dc.contributor.orcidimec | Van Elshocht, Sven::0000-0002-6512-1909 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | N103 | |
dc.source.endpage | N109 | |
dc.source.journal | ECS Journal of Solid State Science and Technology | |
dc.source.issue | 5 | |
dc.source.volume | 2 | |
dc.identifier.url | http://jss.ecsdl.org/content/2/5/N103.short | |
imec.availability | Published - open access | |