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Root-cause analysis of device failure in inverted P3HT:PCBM cells
Publication:
Root-cause analysis of device failure in inverted P3HT:PCBM cells
Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Voroshazi, Eszter
;
Uytterhoeven, Griet
;
Favia, Paola
;
Cnops, Kjell
;
Cheyns, David
Journal
Abstract
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1943
since deposited on 2021-10-21
Acq. date: 2025-10-26
Citations
Metrics
Views
1943
since deposited on 2021-10-21
Acq. date: 2025-10-26
Citations