Authors

Walke, Amey; Verhulst, Anne; Vandooren, Anne; Verreck, Devin; Simoen, Eddy; Rao, V. Ramgopal; Groeseneken, Guido; Collaert, Nadine; Thean, Aaron

ISSN

0018-9383

Issue

12

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

Part I: Impact of Field Induced Quantum Confinement on Trap Assisted Tunneling in Line TFETs

Publication type

Journal article