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Part I: Impact of Field Induced Quantum Confinement on Trap Assisted Tunneling in Line TFETs

dc.contributor.authorWalke, Amey
dc.contributor.authorVerhulst, Anne
dc.contributor.authorVandooren, Anne
dc.contributor.authorVerreck, Devin
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRao, V. Ramgopal
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-21T14:24:01Z
dc.date.available2021-10-21T14:24:01Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23369
dc.sourceIIOimport
dc.titlePart I: Impact of Field Induced Quantum Confinement on Trap Assisted Tunneling in Line TFETs
dc.typeJournal article
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage4057
dc.source.endpage4064
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue12
dc.source.volume60
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=6656899
imec.availabilityPublished - imec


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