dc.contributor.author | Walke, Amey | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Verreck, Devin | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Rao, V. Ramgopal | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-21T14:24:01Z | |
dc.date.available | 2021-10-21T14:24:01Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23369 | |
dc.source | IIOimport | |
dc.title | Part I: Impact of Field Induced Quantum Confinement on Trap Assisted Tunneling in Line TFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Walke, Amey | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Verreck, Devin | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.contributor.orcidimec | Verreck, Devin::0000-0002-3833-5880 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 4057 | |
dc.source.endpage | 4064 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 12 | |
dc.source.volume | 60 | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=6656899 | |
imec.availability | Published - imec | |