dc.contributor.author | Xu, XiuMei | |
dc.contributor.author | Vereecke, Guy | |
dc.contributor.author | Chen, Chang | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Armini, Silvia | |
dc.contributor.author | Verellen, Niels | |
dc.contributor.author | Struyf, Herbert | |
dc.contributor.author | Holsteyns, Frank | |
dc.contributor.author | De Gendt, Stefan | |
dc.date.accessioned | 2021-10-21T14:47:41Z | |
dc.date.available | 2021-10-21T14:47:41Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23413 | |
dc.source | IIOimport | |
dc.title | Capturing wetting states in nanopatterned silicon | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Xu, XiuMei | |
dc.contributor.imecauthor | Vereecke, Guy | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Armini, Silvia | |
dc.contributor.imecauthor | Verellen, Niels | |
dc.contributor.imecauthor | Struyf, Herbert | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.orcidimec | Xu, XiuMei::0000-0002-3356-8693 | |
dc.contributor.orcidimec | Vereecke, Guy::0000-0001-9058-9338 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Armini, Silvia::0000-0003-0578-3422 | |
dc.contributor.orcidimec | Verellen, Niels::0000-0001-5110-4158 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.source.peerreview | no | |
dc.source.conference | KUL Research Day | |
dc.source.conferencedate | 26/11/2013 | |
dc.source.conferencelocation | Leuven Belgium | |
imec.availability | Published - imec | |