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Low temperature noise spectroscopy of p-channel SOI FinFETs

dc.contributor.authorAchour, Hakim
dc.contributor.authorCretu, Bogdan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoutoure, Jean-Marc
dc.contributor.authorCarin, Regis
dc.contributor.authorTalmat, Rachida
dc.contributor.authorBenfdila, A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T00:43:04Z
dc.date.available2021-10-22T00:43:04Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23467
dc.sourceIIOimport
dc.titleLow temperature noise spectroscopy of p-channel SOI FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage2
dc.source.conference10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI
dc.source.conferencedate26/01/2014
dc.source.conferencelocationTaragona Spain
imec.availabilityPublished - imec


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