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Geometrical structure and interface dependence of bias dtress induced threshold voltage shift in C60-based OFETs
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Geometrical structure and interface dependence of bias dtress induced threshold voltage shift in C60-based OFETs
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ahmed, Rizwan
;
Kadashchuk, Andriy
;
Simbrunner, Clemens
;
Schwabegger, Günther
;
Baig, Muhammad
;
Sitter, Helmut
Journal
ACS Applied Materials & Interfaces
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1892
since deposited on 2021-10-22
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Acq. date: 2025-12-12
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Metrics
Views
1892
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-12
Citations