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Reducing front recombination losses to improve the efficiency of rear junction Cu-plated n-Si cells

dc.contributor.authorAleman, Monica
dc.contributor.authorUruena De Castro, Angel
dc.contributor.authorChoulat, Patrick
dc.contributor.authorHallam, Brett
dc.contributor.authorDang Thi Thuy, Chi
dc.contributor.authorRussell, Richard
dc.contributor.authorDuerinckx, Filip
dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorSzlufcik, Jozef
dc.date.accessioned2021-10-22T00:43:25Z
dc.date.available2021-10-22T00:43:25Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23485
dc.sourceIIOimport
dc.titleReducing front recombination losses to improve the efficiency of rear junction Cu-plated n-Si cells
dc.typeProceedings paper
dc.contributor.imecauthorAleman, Monica
dc.contributor.imecauthorChoulat, Patrick
dc.contributor.imecauthorDang Thi Thuy, Chi
dc.contributor.imecauthorDuerinckx, Filip
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.orcidimecDuerinckx, Filip::0000-0003-2570-7371
dc.source.peerreviewyes
dc.source.beginpage528
dc.source.endpage531
dc.source.conference29th European PV Solar Energy Conference and Exhibition and Exhibition - EUPVSEC
dc.source.conferencedate22/09/2014
dc.source.conferencelocationAmsterdam The Netherlands
dc.identifier.urlhttp://www.eupvsec-proceedings.com/proceedings?fulltext=aleman&paper=28014
imec.availabilityPublished - imec


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