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Impact of traps on the electrical characteristics of GeSn/Ge diodes

dc.contributor.authorBaert, Bruno
dc.contributor.authorGupta, Somya
dc.contributor.authorGencarelli, Federica
dc.contributor.authorLoo, Roger
dc.contributor.authorSimoen, Eddy
dc.contributor.authorNguyen, N.D.
dc.date.accessioned2021-10-22T00:44:21Z
dc.date.available2021-10-22T00:44:21Z
dc.date.issued2014-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23509
dc.sourceIIOimport
dc.titleImpact of traps on the electrical characteristics of GeSn/Ge diodes
dc.typeMeeting abstract
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceE-MRS 2014 Fall Meeting Symposium J: Alternative Semiconductor Integration in Si Microelectronics: Materials, Techniques & Appl.
dc.source.conferencedate15/09/2014
dc.source.conferencelocationWarsaw Poland
imec.availabilityPublished - open access


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