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Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM

dc.contributor.authorBennett, W.
dc.contributor.authorHooten, N.
dc.contributor.authorSchrimpf, R.
dc.contributor.authorReed, R.
dc.contributor.authorMendenhall, M.H.
dc.contributor.authorAlles, M.
dc.contributor.authorBi, J.
dc.contributor.authorZhang, E.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorJurczak, Gosia
dc.contributor.authorFantini, Andrea
dc.date.accessioned2021-10-22T00:45:59Z
dc.date.available2021-10-22T00:45:59Z
dc.date.issued2014
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23537
dc.sourceIIOimport
dc.titleSingle- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM
dc.typeJournal article
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorFantini, Andrea
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage1717
dc.source.endpage1725
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue4
dc.source.volume61
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6870449
imec.availabilityPublished - imec
imec.internalnotesRADECS Radiation Effects on Components and Systems 2013


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