Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM

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Authors

Bennett, W.; Hooten, N.; Schrimpf, R.; Reed, R.; Mendenhall, M.H.; Alles, M.; Bi, J.; Zhang, E.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea

ISSN

0018-9499

Issue

4

Journal

IEEE Transactions on Nuclear Science

Volume

61

Title

Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM

Publication type

Journal article

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