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Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM
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Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bennett, W.
;
Hooten, N.
;
Schrimpf, R.
;
Reed, R.
;
Mendenhall, M.H.
;
Alles, M.
;
Bi, J.
;
Zhang, E.
;
Linten, Dimitri
;
Jurczak, Gosia
;
Fantini, Andrea
Journal
IEEE Transactions on Nuclear Science
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1913
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Metrics
Views
1913
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2025-12-10
Citations