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Challenges and opportunities for stacking ICs

dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-22T00:46:24Z
dc.date.available2021-10-22T00:46:24Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23544
dc.sourceIIOimport
dc.titleChallenges and opportunities for stacking ICs
dc.typeProceedings paper
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.source.peerreviewno
dc.source.conference3D TSV Integration Workshop, Semiconductor Society IEIE and IEEE-CAS, Kyung Hee University
dc.source.conferencedate25/09/2014
dc.source.conferencelocationSuwon Korea
imec.availabilityPublished - imec


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