dc.contributor.author | Boschke, Roman | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Van Campenhout, Joris | |
dc.contributor.author | Verheyen, Peter | |
dc.contributor.author | Pogany, Dionyz | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-22T00:48:27Z | |
dc.date.available | 2021-10-22T00:48:27Z | |
dc.date.issued | 2014-09 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23571 | |
dc.source | IIOimport | |
dc.title | ESD characterization of germanium ESD devices | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Van Campenhout, Joris | |
dc.contributor.imecauthor | Verheyen, Peter | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 68 | |
dc.source.endpage | 76 | |
dc.source.conference | EOS/ESD Symposium Proceedings | |
dc.source.conferencedate | 9/07/2014 | |
dc.source.conferencelocation | Tucson, AZ USA | |
imec.availability | Published - imec | |