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dc.contributor.authorBoschke, Roman
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHellings, Geert
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorScholz, Mirko
dc.contributor.authorMitard, Jerome
dc.contributor.authorMertens, Hans
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorVerheyen, Peter
dc.contributor.authorPogany, Dionyz
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T00:48:27Z
dc.date.available2021-10-22T00:48:27Z
dc.date.issued2014-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23571
dc.sourceIIOimport
dc.titleESD characterization of germanium ESD devices
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.source.peerreviewyes
dc.source.beginpage68
dc.source.endpage76
dc.source.conferenceEOS/ESD Symposium Proceedings
dc.source.conferencedate9/07/2014
dc.source.conferencelocationTucson, AZ USA
imec.availabilityPublished - imec


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