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Electrical and physical characterization of Polycrystalline III-V compounds

dc.contributor.authorCapogreco, Elena
dc.contributor.authorLisoni, Judit
dc.contributor.authorMerckling, Clement
dc.contributor.authorNumata, Toshinori
dc.contributor.authorArreghini, Antonio
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-22T00:52:10Z
dc.date.available2021-10-22T00:52:10Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23606
dc.sourceIIOimport
dc.titleElectrical and physical characterization of Polycrystalline III-V compounds
dc.typeProceedings paper
dc.contributor.imecauthorCapogreco, Elena
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpagena
dc.source.conferenceIEEE Semiconductor Interfaces Specialist Conference - SISC
dc.source.conferencedate10/12/2014
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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