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Low-current conductive filament instability in conductive-bridging memories for non-volatile multilevel cells

dc.contributor.authorCelano, Umberto
dc.contributor.authorGoux, Ludovic
dc.contributor.authorOpsomer, Karl
dc.contributor.authorDetavernier, Crhistophe
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T00:53:36Z
dc.date.available2021-10-22T00:53:36Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23618
dc.sourceIIOimport
dc.titleLow-current conductive filament instability in conductive-bridging memories for non-volatile multilevel cells
dc.typeProceedings paper
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpagena
dc.source.conference45th IEEE Semiconductor Interface Specialists Conference - SISC
dc.source.conferencedate10/12/2014
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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