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Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

dc.contributor.authorCelano, Umberto
dc.contributor.authorGoux, Ludovic
dc.contributor.authorOpsomer, Karl
dc.contributor.authorIapichino, Martina
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorFranquet, Alexis
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorDetavernier, Christophe
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T00:53:44Z
dc.date.available2021-10-22T00:53:44Z
dc.date.issued2014
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23619
dc.sourceIIOimport
dc.titleScanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
dc.typeJournal article
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.source.peerreviewyes
dc.source.beginpage67
dc.source.endpage70
dc.source.journalMicroelectronic Engineering
dc.source.volume120
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S016793171300511X
imec.availabilityPublished - imec


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