Authors

Celano, Umberto; Goux, Ludovic; Opsomer, Karl; Iapichino, Martina; Belmonte, Attilio; Franquet, Alexis; Hoflijk, Ilse; Detavernier, Christophe; Jurczak, Gosia; Vandervorst, Wilfried

ISSN

0167-9317

Journal

Microelectronic Engineering

Volume

120

Title

Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

Publication type

Journal article