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Articles
Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
Publication:
Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Celano, Umberto
;
Goux, Ludovic
;
Opsomer, Karl
;
Iapichino, Martina
;
Belmonte, Attilio
;
Franquet, Alexis
;
Hoflijk, Ilse
;
Detavernier, Christophe
;
Jurczak, Gosia
;
Vandervorst, Wilfried
Journal
Microelectronic Engineering
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1869
since deposited on 2021-10-22
Acq. date: 2025-12-17
Citations
Metrics
Views
1869
since deposited on 2021-10-22
Acq. date: 2025-12-17
Citations