Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

dc.contributor.author	Celano, Umberto
dc.contributor.author	Goux, Ludovic
dc.contributor.author	Opsomer, Karl
dc.contributor.author	Iapichino, Martina
dc.contributor.author	Belmonte, Attilio
dc.contributor.author	Franquet, Alexis
dc.contributor.author	Hoflijk, Ilse
dc.contributor.author	Detavernier, Christophe
dc.contributor.author	Jurczak, Gosia
dc.contributor.author	Vandervorst, Wilfried
dc.contributor.imecauthor	Celano, Umberto
dc.contributor.imecauthor	Goux, Ludovic
dc.contributor.imecauthor	Opsomer, Karl
dc.contributor.imecauthor	Belmonte, Attilio
dc.contributor.imecauthor	Franquet, Alexis
dc.contributor.imecauthor	Hoflijk, Ilse
dc.contributor.imecauthor	Jurczak, Gosia
dc.contributor.imecauthor	Vandervorst, Wilfried
dc.contributor.orcidimec	Celano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimec	Goux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimec	Franquet, Alexis::0000-0002-7371-8852
dc.date.accessioned	2021-10-22T00:53:44Z
dc.date.available	2021-10-22T00:53:44Z
dc.date.issued	2014
dc.identifier.issn	0167-9317
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/23619
dc.identifier.url	http://www.sciencedirect.com/science/article/pii/S016793171300511X
dc.source.beginpage	67
dc.source.endpage	70
dc.source.journal	Microelectronic Engineering
dc.source.volume	120
dc.title	Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
dc.type	Journal article
dspace.entity.type	Publication
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