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Limitation of HF-based chemistry for deep-submicron contact hole cleaning on silicides
Publication:
Limitation of HF-based chemistry for deep-submicron contact hole cleaning on silicides
Date
1998
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Kondoh, Eiichi
;
Alves Donaton, Ricardo
;
Vanhaelemeersch, Serge
;
Maex, Karen
Journal
Journal of the Electrochemical Society
Abstract
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2031
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
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Views
2031
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations