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dc.contributor.authorChatterjee, I
dc.contributor.authorZhang, E.X.
dc.contributor.authorBuva, B. L.
dc.contributor.authorReed, Robert
dc.contributor.authorAlles, M. L.
dc.contributor.authorNahatme, N. N.
dc.contributor.authorBAll, D. R.
dc.contributor.authorSchrimpf, R.
dc.contributor.authorFleedwood, D. M.
dc.contributor.authorMitard, Jerome
dc.contributor.authorLinten, Dimitri
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T00:54:28Z
dc.date.available2021-10-22T00:54:28Z
dc.date.issued2014
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23625
dc.sourceIIOimport
dc.titleGeometry dependence of total dose effects in bulk FINFETs
dc.typeJournal article
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage2951
dc.source.endpage2958
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue6
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6971245
imec.availabilityPublished - imec


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