dc.contributor.author | Chatterjee, I | |
dc.contributor.author | Zhang, E.X. | |
dc.contributor.author | Buva, B. L. | |
dc.contributor.author | Reed, Robert | |
dc.contributor.author | Alles, M. L. | |
dc.contributor.author | Nahatme, N. N. | |
dc.contributor.author | BAll, D. R. | |
dc.contributor.author | Schrimpf, R. | |
dc.contributor.author | Fleedwood, D. M. | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-22T00:54:28Z | |
dc.date.available | 2021-10-22T00:54:28Z | |
dc.date.issued | 2014 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23625 | |
dc.source | IIOimport | |
dc.title | Geometry dependence of total dose effects in bulk FINFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2951 | |
dc.source.endpage | 2958 | |
dc.source.journal | IEEE Transactions on Nuclear Science | |
dc.source.issue | 6 | |
dc.source.volume | 61 | |
dc.identifier.url | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6971245 | |
imec.availability | Published - imec | |