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Channel hot carrier degradation and self-heating effects in FinFETs

dc.contributor.authorCho, Moon Ju
dc.contributor.authorBury, Erik
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T00:58:05Z
dc.date.available2021-10-22T00:58:05Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23651
dc.sourceIIOimport
dc.titleChannel hot carrier degradation and self-heating effects in FinFETs
dc.typeBook chapter
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.beginpage287
dc.source.bookHot Carrier Degradation in Semiconductor Devices
dc.source.endpage307
dc.identifier.urlhttp://rd.springer.com/chapter/10.1007/978-3-319-08994-2_10
imec.availabilityPublished - imec
imec.internalnotesISBN 978-3-319-08994-2


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