Quantitative determination of the dielectric constant of the interfacial layer in PZT ferroelectric capacitors
dc.contributor.author | Bartic, Andrei | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Jin, S. | |
dc.contributor.author | Norga, Gerd | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-09-30T11:26:02Z | |
dc.date.available | 2021-09-30T11:26:02Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2367 | |
dc.source | IIOimport | |
dc.title | Quantitative determination of the dielectric constant of the interfacial layer in PZT ferroelectric capacitors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.source.peerreview | no | |
dc.source.beginpage | 73 | |
dc.source.endpage | 76 | |
dc.source.conference | Applications of Ferroelectrics- ISAF. Proceedings of the 11th IEEE International Symposium | |
dc.source.conferencedate | 24/08/1998 | |
dc.source.conferencelocation | Montreux Switzerland | |
imec.availability | Published - imec |
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