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Enhanced time delay integration imaging using embedded CCD in CMOS technology

dc.contributor.authorDe Moor, Piet
dc.contributor.authorRobbelein, Jo
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorBoulenc, Pierre
dc.contributor.authorErcan, Alper
dc.contributor.authorMinoglou, Kiki
dc.contributor.authorLauwers, Anne
dc.contributor.authorDe Munck, Koen
dc.contributor.authorRosmeulen, Maarten
dc.date.accessioned2021-10-22T01:07:27Z
dc.date.available2021-10-22T01:07:27Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23712
dc.sourceIIOimport
dc.titleEnhanced time delay integration imaging using embedded CCD in CMOS technology
dc.typeProceedings paper
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorBoulenc, Pierre
dc.contributor.imecauthorLauwers, Anne
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage100
dc.source.endpage103
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate13/12/2014
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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