dc.contributor.author | De Roose, Florian | |
dc.contributor.author | Myny, Kris | |
dc.contributor.author | Genoe, Jan | |
dc.contributor.author | Heremans, Paul | |
dc.contributor.author | Dehaene, Wim | |
dc.date.accessioned | 2021-10-22T01:08:03Z | |
dc.date.available | 2021-10-22T01:08:03Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23716 | |
dc.source | IIOimport | |
dc.title | Reducing influence of bias stress on AMOLED displays by driving in linear regime: a sensitivity perspective | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Roose, Florian | |
dc.contributor.imecauthor | Myny, Kris | |
dc.contributor.imecauthor | Genoe, Jan | |
dc.contributor.imecauthor | Heremans, Paul | |
dc.contributor.imecauthor | Dehaene, Wim | |
dc.contributor.orcidimec | De Roose, Florian::0000-0003-4490-5007 | |
dc.contributor.orcidimec | Myny, Kris::0000-0002-5230-495X | |
dc.contributor.orcidimec | Genoe, Jan::0000-0002-4019-5979 | |
dc.contributor.orcidimec | Heremans, Paul::0000-0003-2151-1718 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1382 | |
dc.source.endpage | 1385 | |
dc.source.conference | International Display Workshop - IDW | |
dc.source.conferencedate | 1/12/2014 | |
dc.source.conferencelocation | Niigata Japan | |
imec.availability | Published - imec | |