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dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorRaghavan, Nagarajan
dc.contributor.authorGoux, Ludovic
dc.contributor.authorClima, Sergiu
dc.contributor.authorChen, Yang-Yin
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorCosemans, Stefan
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorWouters, Dirk
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-22T01:12:19Z
dc.date.available2021-10-22T01:12:19Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23740
dc.sourceIIOimport
dc.titleHourglass concept for RRAM: a dynamic and statistical device model
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage245
dc.source.endpage249
dc.source.conferenceIEEE 21st International Symposium on Physical and Failure Analysis of Integrated Circuits - IPFA
dc.source.conferencedate30/06/2014
dc.source.conferencelocationMarina Bay Sands Singapore
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6898205
imec.availabilityPublished - open access


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