Authors

Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W. D.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, A.

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

61

Title

Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions

Publication type

Journal article