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Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions
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Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duan, M.
;
Zhang, J. F.
;
Ji, Z.
;
Zhang, W. D.
;
Kaczer, Ben
;
Schram, Tom
;
Ritzenthaler, Romain
;
Groeseneken, Guido
;
Asenov, A.
Journal
IEEE Transactions on Electron Devices
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Views
1874
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2025-12-09
Citations