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Time-dependent variation: A new defect-based prediction methodology
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Time-dependent variation: A new defect-based prediction methodology
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duan, M.
;
Zhang, J. F.
;
Ji, Z.
;
Zhang, W.
;
Kaczer, Ben
;
Schram, Tom
;
Ritzenthaler, Romain
;
Thean, Aaron
;
Groeseneken, Guido
;
Asenov, A.
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1877
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Acq. date: 2025-12-09
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Metrics
Views
1877
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-09
Citations