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Development and evaluation of the Fast Fourier Transform-SSRM technique

dc.contributor.authorEyben, Pierre
dc.contributor.authorBisiaux, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T01:24:03Z
dc.date.available2021-10-22T01:24:03Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23797
dc.sourceIIOimport
dc.titleDevelopment and evaluation of the Fast Fourier Transform-SSRM technique
dc.typeMeeting abstract
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.beginpageBBB6.03
dc.source.conferenceMRS Spring Meeting Symposium BBB: Advances in Scanning Probe Microscopy for Material Properties
dc.source.conferencedate21/04/2014
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttps://mrsspring14.zerista.com/event/member/107549
imec.availabilityPublished - imec


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