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Generation-recombination and 1/f noise in buried channel pMOSFETs under inversion conditions

dc.contributor.authorLukyanchikova, N. B.
dc.contributor.authorPetrichuk, M. V.
dc.contributor.authorGarbar, N. P.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T12:43:18Z
dc.date.available2021-09-29T12:43:18Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/237
dc.sourceIIOimport
dc.titleGeneration-recombination and 1/f noise in buried channel pMOSFETs under inversion conditions
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage384
dc.source.endpage389
dc.source.conferenceProceedings of the 7th Vilnius Conference on Fluctuation Phenomena in Physical Systems
dc.source.conferencedate4/10/1994
dc.source.conferencelocationPalanga Lithuania
imec.availabilityPublished - open access


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