dc.contributor.author | Fang, Chao | |
dc.contributor.author | Smith, Mark D | |
dc.contributor.author | Vaglio Pret, Alessandro | |
dc.contributor.author | Biafore, John | |
dc.contributor.author | Robertson, Steward A | |
dc.contributor.author | Bekaert, Joost | |
dc.date.accessioned | 2021-10-22T01:25:09Z | |
dc.date.available | 2021-10-22T01:25:09Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23802 | |
dc.source | IIOimport | |
dc.title | A compact physical CD-SEM simulator for IC photolithography modeling applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vaglio Pret, Alessandro | |
dc.contributor.imecauthor | Bekaert, Joost | |
dc.contributor.orcidimec | Bekaert, Joost::0000-0003-3075-3479 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 923618 | |
dc.source.conference | Scanning Microscopies 2014 | |
dc.source.conferencedate | 16/09/2014 | |
dc.source.conferencelocation | Monterey, CA USA | |
dc.identifier.url | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1906647 | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 9236 | |