Show simple item record

RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETs

dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorWaldron, Niamh
dc.contributor.authorRoussel, Philippe
dc.contributor.authorAlian, AliReza
dc.contributor.authorPourghaderi, Mohammad Ali
dc.contributor.authorJi, Zhigang
dc.contributor.authorGrasser, Tibor
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorSioncke, Sonja
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T01:32:11Z
dc.date.available2021-10-22T01:32:11Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23832
dc.sourceIIOimport
dc.titleRTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage506
dc.source.endpage509
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate15/12/2014
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record