Show simple item record

OPV stability: Designed to last

dc.contributor.authorGilot, Jan
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorGalagan, Yulia
dc.contributor.authorVeenstra, Sjoerd
dc.contributor.authorAndriessen, Ronn
dc.date.accessioned2021-10-22T01:39:32Z
dc.date.available2021-10-22T01:39:32Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23862
dc.sourceIIOimport
dc.titleOPV stability: Designed to last
dc.typeOral presentation
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorAndriessen, Ronn
dc.source.peerreviewno
dc.source.conference25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF
dc.source.conferencedate29/09/2014
dc.source.conferencelocationBerlin Germany
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record