Publication:

Characterization and modeling of charge trapping: From single defects to devices

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1892 since deposited on 2021-10-22
2last month
Acq. date: 2026-02-27

Citations

Statistics

Views

1892 since deposited on 2021-10-22
2last month
Acq. date: 2026-02-27

Citations