dc.contributor.author | Gupta, Somya | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Dobri, Adam | |
dc.contributor.author | Vrielinck, Henk | |
dc.contributor.author | Lauwaert, Johan | |
dc.contributor.author | Merckling, Clement | |
dc.contributor.author | Gencarelli, Federica | |
dc.contributor.author | Shimura, Yosuke | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-22T01:47:39Z | |
dc.date.available | 2021-10-22T01:47:39Z | |
dc.date.issued | 2014-10 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23892 | |
dc.source | IIOimport | |
dc.title | Profiling of border traps at GeSn and high-K oxide interface | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.source.peerreview | yes | |
dc.source.beginpage | P3-1647 | |
dc.source.conference | Japanese Society for the Promotion of Sciences - JSPS | |
dc.source.conferencedate | 5/10/2014 | |
dc.source.conferencelocation | Cancun Mexico | |
imec.availability | Published - imec | |