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Diamond tips for electrical AFM measurements with sub-nanometer resolution

dc.contributor.authorHantschel, Thomas
dc.contributor.authorTsigkourakos, Menelaos
dc.contributor.authorParedis, Kristof
dc.contributor.authorEyben, Pierre
dc.contributor.authorNuytten, Thomas
dc.contributor.authorSchulze, Andreas
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T01:51:08Z
dc.date.available2021-10-22T01:51:08Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23906
dc.sourceIIOimport
dc.titleDiamond tips for electrical AFM measurements with sub-nanometer resolution
dc.typeMeeting abstract
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.source.peerreviewno
dc.source.conference16th International Scanning Probe Microscopy Meeting - ISPM
dc.source.conferencedate29/06/2014
dc.source.conferencelocationSeoul South Korea
imec.availabilityPublished - imec


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