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Preliminary results on high dose testing of semiconductor photonic sources: a comparison of VCSELs and resonant-cavity LEDs

dc.contributor.authorBerghmans, F.
dc.contributor.authorCoenen, S.
dc.contributor.authorBrichard, B.
dc.contributor.authorVos, F.
dc.contributor.authorDecréton, M.
dc.contributor.authorVerschaffelt, G.
dc.contributor.authorde la Fuente, A.
dc.contributor.authorVeretennicoff, I.
dc.contributor.authorThienpont, H.
dc.contributor.authorBockstaele, Ronny
dc.contributor.authorBienstman, Peter
dc.contributor.authorSys, Carl
dc.contributor.authorDhoedt, Bart
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorBaets, Roel
dc.contributor.authorVan Daele, Peter
dc.contributor.authorJonsson, J.
dc.date.accessioned2021-09-30T11:27:59Z
dc.date.available2021-09-30T11:27:59Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2393
dc.sourceIIOimport
dc.titlePreliminary results on high dose testing of semiconductor photonic sources: a comparison of VCSELs and resonant-cavity LEDs
dc.typeProceedings paper
dc.contributor.imecauthorBienstman, Peter
dc.contributor.imecauthorDhoedt, Bart
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorVan Daele, Peter
dc.contributor.orcidimecBienstman, Peter::0000-0001-6259-464X
dc.contributor.orcidimecDhoedt, Bart::0000-0002-7271-7479
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecVan Daele, Peter::0000-0003-0557-7741
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage47
dc.source.endpage56
dc.source.conferencePhotonics for Space Environments VI
dc.source.conferencedate19/07/1998
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 3440


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