Show simple item record

Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films

dc.contributor.authorHoenicke, Philipp
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorHermann, Peter
dc.contributor.authorBeckhoff, Burkhard
dc.date.accessioned2021-10-22T02:01:12Z
dc.date.available2021-10-22T02:01:12Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23944
dc.sourceIIOimport
dc.titleGrazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films
dc.typeMeeting abstract
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.source.peerreviewno
dc.source.conferenceEuropean Conference on X-Ray Spectrometry - EXRS
dc.source.conferencedate15/06/2014
dc.source.conferencelocationBologna Italy
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record