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Reference-free, in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis

dc.contributor.authorHoenicke, Philipp
dc.contributor.authorMueller, Matthias
dc.contributor.authorDetlefs, Blanka
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorBeckhoff, Burkhard
dc.date.accessioned2021-10-22T02:01:42Z
dc.date.available2021-10-22T02:01:42Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23945
dc.sourceIIOimport
dc.titleReference-free, in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis
dc.typeMeeting abstract
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.source.peerreviewyes
dc.source.beginpagena
dc.source.conferenceEuropean Conference on X-Ray Spectrometry - EXRS
dc.source.conferencedate15/06/2014
dc.source.conferencelocationBologna Italy
imec.availabilityPublished - imec


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