Show simple item record

Reference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis

dc.contributor.authorHoenicke, Philipp
dc.contributor.authorMueller, Matthias
dc.contributor.authorDetlefs, Blanka
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorBeckhoff, Burkhard
dc.date.accessioned2021-10-22T02:01:58Z
dc.date.available2021-10-22T02:01:58Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23946
dc.sourceIIOimport
dc.titleReference-free, depth dependent characterization of nanoscale materials by combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis
dc.typeMeeting abstract
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.source.peerreviewno
dc.source.beginpagena
dc.source.conference79. Jahrestagung der DPG und DPG-Frühjahrstagung
dc.source.conferencedate15/03/2015
dc.source.conferencelocationBerlin Germany
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record