dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Chen, Chris | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Watt, Jeff | |
dc.contributor.author | Chanda, Kaushik | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Grasser, Tibor | |
dc.date.accessioned | 2021-10-22T02:24:59Z | |
dc.date.available | 2021-10-22T02:24:59Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24021 | |
dc.source | IIOimport | |
dc.title | Maximizing reliable performance of CMOS applications–A comprehensive study of FPGA pass gates | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Chen, Chris | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2D.4 | |
dc.source.conference | International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 1/06/2014 | |
dc.source.conferencelocation | Waikoloa, HI USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6860596&contentType=Conference+Publications | |
imec.availability | Published - imec | |