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Application of scanning spreading resistance microscopy (SSRM) for GaN-on-silicon power structures

dc.contributor.authorKandaswamy, Prem Kumar
dc.contributor.authorSaripalli, Yoga
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorYou, Shuzhen
dc.contributor.authorZhao, Ming
dc.contributor.authorLiang, Hu
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorVanderheyden, Annelies
dc.contributor.authorSchulze, Andreas
dc.contributor.authorEyben, Pierre
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorLanger, Robert
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T02:27:56Z
dc.date.available2021-10-22T02:27:56Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24030
dc.sourceIIOimport
dc.titleApplication of scanning spreading resistance microscopy (SSRM) for GaN-on-silicon power structures
dc.typeMeeting abstract
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.source.peerreviewyes
dc.source.conferenceInternational Workshop on Nitride Semiconductors - IWN
dc.source.conferencedate24/08/2014
dc.source.conferencelocationWroclaw Poland
imec.availabilityPublished - imec
imec.internalnotesProceedings in special ssues in physica status solidi (a/b)


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