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ESD protection methodology for deep-submicron CMOS

dc.contributor.authorBock, Karlheinz
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-30T11:29:08Z
dc.date.available2021-09-30T11:29:08Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2405
dc.sourceIIOimport
dc.titleESD protection methodology for deep-submicron CMOS
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage997
dc.source.endpage1007
dc.source.conferenceProceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF
dc.source.conferencedate5/10/1998
dc.source.conferencelocation
imec.availabilityPublished - open access
imec.internalnotesSpecial issue Microelectronics Reliability 38(1998)


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